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Journal of Applied Physics,
vol. 82, pp. 510–513, 1997
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Field Characterization of a D-Shaped Optical Fiber Using
Scanning Near-Field Optical Microscopy
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S. T. Huntington, K. A. Nugent,
A. Roberts, P. Mulvaney, and
K. M. Lo
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Abstract:
Scanning near-field optical microscopy
is used to measure the
mode profile and evanescent field of a Ge-doped D-shaped
optical fiber. The structure of the fiber is determined by
differential etching followed by an investigation of the
resultant topography with an atomic force microscope.
This information is then used to theoretically model
the expected behavior of the fiber and it is shown that
the theoretical results are in excellent agreement with
the experimentally observed field.